Project Overview
TZTEK’s AOI equipment for array processing adopts TZTEK’s
independently developed Virgo software platform and a unique platform
calibration technology. It is suitable for defect detection in array substrates
throughout the manufacturing process, and features fast scanning speed and high
imaging accuracy (detection precision of 1.0 μm/1.5 μm available).
Program Advantage
TZTEK's unique calibration platform technology
supports better image stitching and realizes regional detection. Periodic
comparison is adopted for the AA zones, while panel-to-panel comparison is
adopted for the peripheral zones
TZTEK’s independently developed Virgo software
platform supports the creation of rectangular, circular, semicircular, and other
irregular maps
Detection precision of 1.0 μm / 1.5 μm available